Camus - David Sherman

Product Description

Reflecting the profound influence he continues to exert on popular consciousness, Sherman examines the complete body of works of French author and philosopher Albert Camus, providing a comprehensive analysis of Camus’ most important works—most notably The Myth of Sisyphus, The Stranger, The Fall, The Plague, and The Rebel—within the framework of his basic ethical orientation.

  • Makes Camus’ concerns clear in terms that will resonate with contemporary readers
  • Reveals the unity and integrity of Camus’ writings and political activities
  • Discusses Camus’ ongoing relevance by showing how he prefigures many postmodern positions in philosophy, literature, and politics.

 “Sherman's book provides an excellent account of Camus' fortunes and misfortunes in the intellectual realm in France immediately following the war.” (Notre Dame Philosophical Reviews, April 2009)

“Sherman persuasively argues that what emerges from Camus’s writing is the portrait of a man of courage and decency. Recommended to all academic libraries and university foreign-language departments with strong French programs.” (Library Journal, February 2009)

"Despite Camus's own reluctance to be regarded as 'a philosopher' and 'an existentialist', David Sherman's authoritative study establishes the importance of Camus's contribution – in his fiction as well as his essays – to existential philosophy. Sherman's Camus is an engaging man of 'decency and courage', and a great writer who eloquently articulated the modern human predicament."
–Professor David Cooper, Durham University

Customer Rating

Be the first to review this product

Add Items to Cart Add to Cart
Book Genre Philosophy, Reference
Book Format Unabridged
Binding Paperback
Publisher Wiley-Blackwell
Number of pages 252
ISBN 978-1405159319
Date of Publication 2008
Language No
Level No
Media Type Book
Add Your Tags:
Add Tags
Use spaces to separate tags. Use single quotes (') for phrases.

Write Your Own Review

Only registered users can write reviews. Please, log in or register